Investigation of source-to-drain capacitance by DIBL effect of silicon nanowire MOSFETs

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Investigation of source-to-drain capacitance by DIBL effect of silicon nanowire MOSFETs

We investigated the source-to-drain capacitance (Csd) due to DIBL effect of silicon nanowire (SNW) MOSFETs. Short-channel SNW devices operating at high drain voltages have the positive value of Csd by DIBL effect. On the other hand, junctionless SNW MOSFETs without source/drain (S/D) PN junctions have negative or zero values by small DIBL effect. By considering the additional source-todrain cap...

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ژورنال

عنوان ژورنال: IEICE Electronics Express

سال: 2010

ISSN: 1349-2543

DOI: 10.1587/elex.7.1499